|
9031.10.00.00 |
Machines for balancing mechanical parts |
|
9031.20.00.00 |
Test benches |
|
9031.41.00. |
For inspecting semiconductorwafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductordevices |
|
9031.49.10.00 |
Profile projectors |
|
9031.49.40.00 |
Coordinate-measuring machines |
|
9031.49.70.00 |
For inspecting masks (other than photomasks) used in manufacturingsemiconductor devices; for measuring surface particulate contamination on semiconductordevices |
|
9031.49.90.00 |
Other |
|
9031.80.40.00 |
Electron beam microscopes fitted with equipmentspecifically designed for the handling and transport of semiconductor wafers or reticles |
|
9031.80.80. |
Other |
|
9031.90.20.00 |
Of profile projectors |
|
9031.90.45.00 |
Bases and frames for the coordinate-measuring machines of subheading9031.49.40 |
|
9031.90.54.00 |
Of optical instruments and appliances of subheading 9031.41 or 9031.49.70 |
|
9031.90.58.00 |
Other |
|
9031.90.70.00 |
Of articles of subheading 9031.80.40 |
|
9031.90.90. |
Other |
