9031.49.70.00
Heading/ Subheading |
Stat Suffix | Article Description | Unit of Quantity | General (column 1) | Special (column 1) | Column 2 |
---|---|---|---|---|---|---|
9031 | Measuring or checking instruments, appliances and machines, not specified orincluded elsewhere in this chapter; profile projectors; parts and accessories thereof: | n/a | n/a | n/a | n/a | |
9031 49 | Other: | n/a | n/a | n/a | n/a | |
9031 49 70 | 00 | For inspecting masks (other than photomasks) used in manufacturingsemiconductor devices; for measuring surface particulate contamination on semiconductordevices | No. | Free | n/a | 50% |